The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Feb. 25, 2021
Applicant:
Centre National D'etudes Spatiales, Paris, FR;
Inventor:
Eric Pequignot, Pompertuzat, FR;
Assignee:
CENTRE NATIONAL D'ETUDES SPATIALES, Paris, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 15/06 (2006.01); G01N 21/31 (2006.01); G01W 1/06 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0075 (2013.01); G01N 15/06 (2013.01); G01N 21/31 (2013.01); G01W 1/06 (2013.01); G01N 2015/0693 (2013.01); G01N 2021/1795 (2013.01);
Abstract
The present disclosure relates to a method and a device for measuring at least one atmospheric parameter (gas, temperature). The method includes implementing steps of acquiring spectral images in the ultraviolet and/or the visible and/or the infrared range and scanning according to a tomographic principle. The spectral images are acquired using a network of optical systems such as infrared cameras, and are used to estimate the air quality and/or meteorological and/or climate parameters in a geographic area, for example an urban agglomeration.