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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11885779 B1

PDFFull Text
Date of Patent:
Jan. 30, 2024

Filed:

Apr. 13, 2021

Ultraviolet monitoring of chromatography performance by orthogonal partial least squares

Applicant:

Regeneron Pharmaceuticals, Inc., Tarrytown, NY (US);

Inventors:

Eric Shierly, Nassau, NY (US);

Kevin Brennan, Menands, NY (US);

Nathan Mao, Cohoes, NY (US);

Assignee:

Regeneron Pharmaceuticals, Inc., Tarrytown, NY (US);

Attorney:

Schwabe, Williamson & Wyatt PC

Primary Examiner:

Jeffrey P Aiello

Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01N 21/33 (2006.01); G01N 30/88 (2006.01); G01N 30/74 (2006.01); G01N 1/34 (2006.01); G01N 30/04 (2006.01); G01N 33/48 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/74 (2013.01); G01N 1/34 (2013.01); G01N 21/33 (2013.01); G01N 30/04 (2013.01); G01N 30/88 (2013.01); G01N 33/48 (2013.01); G06F 17/18 (2013.01); G01N 2030/027 (2013.01); G01N 2030/8886 (2013.01);
Abstract

Disclosed are methods for monitoring column chromatography performance. The methods can include acquiring one or more chromatogram ultraviolet (UV) traces generated by a chromatography system during sample purification and/or separation; and analyzing the one or more acquired chromatogram UV traces with an orthogonal partial least squares (OPLS) model, thereby allowing detection of column deterioration prior to column failure and quantitative analysis of UV signal in the one or more chromatogram UV traces.

Find Patent Forward Citations

Shierly, Eric. (2024). Ultraviolet monitoring of chromatography performance by orthogonal partial least squares (U.S. Patent No. 11885779). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11885779

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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