The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jun. 21, 2021
Applicant:

Raytheon Technologies Corporation, Farmington, CT (US);

Inventors:

Bruno Abreu Calfa, Vernon, CT (US);

Mahmoud El Chamie, Rocky Hill, CT (US);

Amit Surana, Newington, CT (US);

Ozgur Erdinc, Mansfield, CT (US);

Assignee:

RTX Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/34 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/048 (2013.01); G01N 29/043 (2013.01); G01N 29/343 (2013.01); G01N 29/4445 (2013.01); G01N 29/4481 (2013.01); G01N 2291/102 (2013.01);
Abstract

A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for detecting a sub-surface defect, the set of instructions comprising an instruction to receive scan data for a part from a transducer; an instruction to collect the scan data; an instruction to determine an indication in the scan data that indicates a distractor, wherein the indication is based on a learning phase module and an inference phase module that the processor uses to self-assess the indication; and an instruction to create a defect indication report.


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