The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Nov. 02, 2020
Tintometer Gmbh, Dortmund, DE;
Perry Palumbo, Fort Collins, CO (US);
Elmar Grabert, Dortmund, DE;
Tintometer GmbH, Dortmund, DE;
Abstract
Nephelometric measuring devices are described. The nephelometric measuring devices can be configured such that an amount of scattered light having different pathlengths impingent upon one or more scattered-light detectors from a beam propagating through a suspension can result in substantially equivalent sensitivity and in correlation between the scattered-light detectors' response and a turbidity value of the suspension. The response of the scattered-light detector(s) receiving scattered light at a nephelometric angle of 85-110° from a beam of light propagating through the suspension can be in accordance to an equation selected from a group of non-linear equations where: x/y=ax+ax+ . . . +ax+ax+a; where 'n' is an integer greater than 0; “x” is equal to the turbidity value of the suspension; “y” is equal to the response of the scattered-light detector; and “a” are calibration coefficients. The maximum response of the scattered-light detector occurs at a turbidity value dependent upon the effective scattered-light pathlength.