The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Mar. 28, 2022
Seiko Epson Corporation, Tokyo, JP;
Kenta Sato, Shiojiri, JP;
Abstract
An abnormality determination method includes: a first distance calculation step of calculating, based on measurement data of an object, a first Mahalanobis distance in a first unit space corresponding to a normal mode of the object; a second distance calculation step of calculating, based on the measurement data, an (i+1)-th Mahalanobis distance in an (i+1)-th unit space corresponding to an i-th abnormal mode of the object for each integer i greater than or equal to 1 and less than or equal to N, N being an integer greater than or equal to 2; and an abnormality determination step of determining, based on the second to (N+1)-th Mahalanobis distances, one of the first to N-th abnormal modes where the object is when the first Mahalanobis distance exceeds a threshold value.