The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Dec. 17, 2020
Applicant:

National Chung Shan Institute of Science and Technology, Taoyuan, TW;

Inventors:

Shiang-Feng Tang, Taoyuan, TW;

Shun-Lung Yen, Taoyuan, TW;

Kun-Chi Lo, Taoyuan, TW;

Wen-Jen Lin, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/068 (2022.01); G01J 5/00 (2022.01); G01J 5/80 (2022.01);
U.S. Cl.
CPC ...
G01J 5/068 (2022.01); G01J 5/80 (2022.01); G01J 2005/0077 (2013.01);
Abstract

A high-precision non-contact temperature measurement device includes: a thermal insulation box made of a thermal insulation material and having therein a receiving space; a dynamic constant-temperature feedback control module for controlling temperature of the receiving space; and a non-temperature-sensing thermal imager disposed in the receiving space. The device achieves system thermal insulation within a non-contact temperature measurement gauge, maintains the overall closed system dynamically at constant temperature, compensates for effects of internal chip self-heating effect and visual field background temperature variation, and finally calculates average temperature of surfaces of a target precisely with an imaging, non-contact temperature measurement gauge and a temperature calibration algorithm widely used in thermal-imaging non-contact temperature measurement.


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