The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Sep. 02, 2021
Mettler-toledo (Changzhou) Precision Instruments Co., Ltd, Changzhou, CN;
Mettler-toledo (Changzhou) Measurement Technology Co., Ltd, Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd, Shanghai, CN;
Jinjie Cai, Changzhou, CN;
Xiang Li, Changzhou, CN;
Zhihe Chao, Changzhou, CN;
Chenggang Ding, Changzhou, CN;
Xiaomin Zhang, Changzhou, CN;
Chunhui Li, Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd, Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd, Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd, Shanghai, CN;
Abstract
Accurate weighing and measurement of fine materials is provided by a linear compensation apparatus and a weighing system. The linear compensation apparatus has a weight loading mechanism () with a bearing plate (), a drive apparatus (), and a measuring weight (). The drive apparatus is mounted onto the bearing plate, the measuring weight is connected to the drive apparatus, and, by hoisting or lowering the measuring weight with the drive apparatus, loads from the bearing plate are adjusted. The linear compensation apparatus and the weighing system greatly reduce device costs and labor costs in a batching process, save time and effort, have no risk of cross-contamination, and achieve automated production operation.