The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Mar. 14, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yui Ishida, Nara, JP;

Naoki Yoshitake, Kusatsu, JP;

Yoshitaka Tsurukame, Tokyo, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/667 (2022.01); G01F 25/10 (2022.01); G01F 1/66 (2022.01); G01N 11/04 (2006.01);
U.S. Cl.
CPC ...
G01F 1/668 (2013.01); G01F 1/662 (2013.01); G01F 25/10 (2022.01); G01N 11/04 (2013.01);
Abstract

A flow-rate measuring apparatus transmits a first measurement signal having at least one first frequency by a first transducer, and receives the first measurement signal by a second transducer through a fluid inside a pipe. The flow-rate measuring apparatus determines a second frequency based on the first measurement signal. The flow-rate measuring apparatus transmits a second measurement signal having the second frequency by a third transducer toward an interface between the pipe and the fluid, and receives the second measurement signal reflected at the interface by a fourth transducer. The flow-rate measuring apparatus calculates a flow rate of the fluid inside the pipe so as to reflect a viscosity of the fluid based on the first and second measurement signals.


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