The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Oct. 12, 2021
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Adam S. Wang, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
An x-ray apparatus includes an x-ray source capable of producing an x-ray beam with a focal spot having a spatial shape that is selected to pre-amplify predetermined spatial frequencies exceeding half a cutoff frequency as compared to spatial frequencies below half the cutoff frequency; an x-ray detector capable of detecting the x-ray beam; and a processor adapted to reconstruct an image from the detected x-ray beam using a filter that compensates the pre-amplified predetermined spatial frequencies. The spatial shape comprises two or more disconnected regions that preferably have widths less than that of a nominal focal spot, combined widths greater than or equal to that of a nominal focal spot, and are separated by less than three times a width of a nominal focal spot.