The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Feb. 25, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kun Sun Eom, Yongin-si, KR;

Sang Kyu Kim, Yongin-si, KR;

Yoon Jae Kim, Seoul, KR;

Hyun Seok Moon, Hwaseong-si, KR;

Jin Young Park, Hwaseong-si, KR;

Sung Mo Ahn, Yongin-si, KR;

Myoung Hoon Jung, Bucheon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/1495 (2006.01); A61B 5/00 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1455 (2013.01); A61B 5/1495 (2013.01); A61B 5/7278 (2013.01); A61B 5/742 (2013.01); A61B 5/7405 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 5/443 (2013.01); A61B 5/681 (2013.01); A61B 5/6803 (2013.01); A61B 5/6898 (2013.01);
Abstract

An apparatus for estimating a component of an analyte may include a sensor including a light source configured to emit light to the analyte, and a detector configured to measure a spectrum of light reflected from the analyte; and a processor configured to: based on an initial amount of received light being obtained from the analyte by operating the sensor under initial operating conditions, determine optimal operating conditions based on the initial amount of received light and the initial operating conditions; and based on a spectrum being measured from the analyte by operating the sensor under the optimal operating conditions, estimate the component of the analyte based on the spectrum.


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