The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Sep. 28, 2020
Nidek Co., Ltd., Aichi, JP;
Ryosuke Shiba, Aichi, JP;
Yukihiro Higuchi, Aichi, JP;
Shinya Iwata, Aichi, JP;
Junpei Nishiyama, Aichi, JP;
Hideki Aono, Aichi, JP;
Hirofumi Yogo, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
Provided are ophthalmologic image processing method, including an acquisition step of acquiring OCT data of an eye to be examined based on a spectral interference signal output from an OCT optical system, a setting step of setting a depth region including an image position of a tissue as an extraction region for data on one-direction side from a zero delay position in the OCT data, and a display control step of extracting extracted OCT data corresponding to the extraction region from the OCT data and displaying the extracted OCT data in a display region set in advance on a monitor, and an OCT apparatus that executes the method.