The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Aug. 24, 2022
Fujitsu Limited, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
The present disclosure provides an apparatus and method for measuring a nonlinear signal-to-noise ratio, and a test instrument. The method for measuring a nonlinear signal-to-noise ratio may include performing notch operation on at least one frequency point in a spectrum of an input signal in a symbol domain or a bit domain; performing spectrum measurement on an output signal after passing through a nonlinear system; and estimating a nonlinear signal-to-noise ratio of at least one frequency point of the nonlinear system according to a spectrum of the output signal. According to the embodiments of the present disclosure, when the notch operation is performed, internal structures of symbols or bits of the input signal may be retained, and an accuracy of the measurement of the nonlinear signal-to-noise ratio may be improved.