The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Feb. 11, 2021
Zhejiang University, Hangzhou, CN;
Hui Fang, Hangzhou, CN;
Yong He, Hangzhou, CN;
Zeqing Zhang, Hangzhou, CN;
Shupei Xiao, Hangzhou, CN;
Zhejiang University, Hangzhou, CN;
Abstract
Provided is a method and system for determining plant leaf surface roughness. The method includes: acquiring a plurality of continuously captured zoomed-in leaf images by using a zoom microscope image capture system; determining a feature match set according to the zoomed-in leaf images; removing de-noised images of which the number of feature matches in feature match set is less than a second set threshold, to obtain n screened images; combining the n screened images to obtain a combined grayscale image; and determining plant leaf surface roughness according to the combined grayscale image. In the present disclosure, first, a plurality of zoomed-in leaf images are directly acquired by the zoom microscope image capture system quickly and accurately; the zoomed-in leaf images are then screened and combined to form a combined grayscale image; finally, three-dimensional roughness of a plant leaf surface is determined quickly and accurately according to the combined grayscale image.