The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Dec. 20, 2019
Applicant:
Boe Technology Group Co., Ltd., Beijing, CN;
Inventors:
Zhaoyue Li, Beijing, CN;
Dong Chai, Beijing, CN;
Yaoping Wang, Beijing, CN;
Meijuan Zhang, Beijing, CN;
Hong Wang, Beijing, CN;
Assignee:
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G05B 19/418 (2006.01); G06V 10/82 (2022.01); G06V 10/96 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G05B 19/41875 (2013.01); G06V 10/82 (2022.01); G06V 10/96 (2022.01); G05B 2219/32368 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.