The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Jan. 28, 2021
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Ramesh Doddaiah, Westborough, MA (US);

Steve Lathrop, Milford, MA (US);

Anoop Raghunathan, Ashland, MA (US);

Jeremy O'Hare, Westborough, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0689 (2013.01);
Abstract

Aspects of the present disclosure relate to data deduplication (dedup) techniques for storage arrays. In embodiments, a sequence of input/output (IO) operations in an IO stream received from one or more host devices by a storage array are identified. Additionally, a determination can be made as to whether a set of previously received IO operations match the identified IO sequence based on a time series relationship between the identified IO sequence and the previously received IO operations. Further, one or more data deduplication (dedup) techniques can be performed on the matching IO sequence.


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