The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Jun. 17, 2022
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Jacob Kappeler Oshins, Seattle, WA (US);

Hari Angepat, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 8/658 (2018.01); G06F 16/14 (2019.01); G06F 16/11 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3013 (2013.01); G06F 8/658 (2018.02); G06F 11/3006 (2013.01); G06F 16/119 (2019.01); G06F 16/144 (2019.01);
Abstract

A system for capturing hardware telemetry includes a hardware component encoded with hardware logic for emitting a telemetry stream into memory of a computing device. The system further includes a hardware component driver stored in the memory that is configured to parse the telemetry stream, populate telemetry structures defined within a telemetry event schema based on values parsed from the telemetry stream, and generate a telemetry record including the populated telemetry structures.


Find Patent Forward Citations

Oshins, Jacob. (2024). Telemetry generation for in-field hardware testing (U.S. Patent No. 11880288). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11880288

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…