The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Feb. 12, 2019
Applicant:
Lg Chem, Ltd., Seoul, KR;
Inventors:
Jinseok Byun, Daejeon, KR;
Inyoung Song, Daejeon, KR;
Dong Hyun Kim, Daejeon, KR;
Kwangseok Seo, Daejeon, KR;
Yeongrae Chang, Daejeon, KR;
Assignee:
LG CHEM, LTD., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/115 (2015.01); G02B 1/14 (2015.01); G02B 1/08 (2006.01); G02B 5/30 (2006.01); G02F 1/1335 (2006.01); G02B 1/11 (2015.01);
U.S. Cl.
CPC ...
G02B 1/115 (2013.01); G02B 1/08 (2013.01); G02B 1/11 (2013.01); G02B 1/14 (2015.01); G02B 5/3033 (2013.01); G02F 1/133541 (2021.01); C09K 2323/03 (2020.08);
Abstract
The present invention relates to anti-reflective films including: a light-transmitting substrate; a hard coating layer; and a low refractive layer, wherein the low refractive layer includes a first region including a binder resin and high refractive inorganic nanoparticles and a second region including a binder resin and low refractive inorganic nanoparticles, and when polarization ellipticity measured by ellipsometry is fitted to a Cauchy model for each of the first region and the second region, predetermined requirements are fulfilled.