The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Jun. 23, 2021
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Wilson Pradeep, Bangalore, IN;
Prakash Narayanan, Bangalore, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G11C 29/56 (2006.01); G06F 11/10 (2006.01); G11C 29/36 (2006.01); G11C 29/42 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31718 (2013.01); G01R 31/31724 (2013.01); G06F 11/1048 (2013.01); G06F 11/1068 (2013.01); G11C 29/36 (2013.01); G11C 29/42 (2013.01); G11C 29/56004 (2013.01); G11C 2029/3602 (2013.01); G11C 2029/5602 (2013.01);
Abstract
A circuit includes a multipath memory having multiple cells and a plurality of sequence generators. Each sequence generator of the plurality of sequence generators drives one separate cell of the multiple cells via an automatic test pattern generator (ATPG) mode signal for each cell. The ATPG mode signal for each cell is configured via a sequence configuration input that controls a timing sequence to test each cell. The state of the ATPG mode signal of each cell selects whether test data or functional data is output from the respective cell.