The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Feb. 08, 2023
Applicant:

Access Medical Systems, Ltd., Palo Alto, CA (US);

Inventors:

Hong Tan, San Jose, CA (US);

Ming Xia, Shanghai, CN;

Yushan Tan, Shanghai, CN;

Jun Chen, Shanghai, CN;

Erhua Cao, Shanghai, CN;

Genqian Li, Shanghai, CN;

Robert F. Zuk, Menlo Park, CA (US);

Assignee:

ACCESS MEDICAL SYSTEMS, LTD., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B65G 47/90 (2006.01); G01N 35/00 (2006.01); B01L 3/00 (2006.01); G01N 33/543 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00 (2013.01); B01L 3/527 (2013.01); G01N 33/54353 (2013.01); G01N 33/54366 (2013.01); B01L 3/502 (2013.01); B01L 2200/16 (2013.01); B01L 2300/042 (2013.01); B01L 2300/045 (2013.01); G01N 35/026 (2013.01); G01N 2035/0436 (2013.01);
Abstract

This invention relates to an apparatus for conducting immunoassay test. The apparatus includes a groove unit having a groove along a vertical direction configured to hold a rod-shaped portion of a probe along the vertical direction, and a push pin configured to move along a horizontal direction, the push pin being capable of residing at a first position and a second position. A tip of the push pin is capable of pressing the rod-shaped portion of the probe against the groove when the push pin resides at the first position. The distance between the tip of the push pin and the groove is larger than a diameter of the rod-shaped portion of the probe when the push pin resides at the second position.


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