The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Aug. 01, 2023
Applicant:

Chengdu University of Technology, Chengdu, CN;

Inventors:

Yiquan Ma, Chengdu, CN;

Xiaofeng Liu, Chengdu, CN;

Yangbo Lu, Chengdu, CN;

Yongchao Lu, Chengdu, CN;

Chen Zhang, Chengdu, CN;

Xuebin Du, Chengdu, CN;

Zhanhong Liu, Chengdu, CN;

Wei Wei, Chengdu, CN;

Yi Shu, Chengdu, CN;

Jingyu Zhang, Chengdu, CN;

Ke Zhao, Chengdu, CN;

Qinyu Cui, Chengdu, CN;

Hao Wang, Chengdu, CN;

Xiaojie Fan, Chengdu, CN;

Caiguang Zhi, Chengdu, CN;

Mengtian Gao, Chengdu, CN;

Lingna Shi, Chengdu, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/24 (2006.01); G01N 23/2005 (2018.01); G01N 1/28 (2006.01); G06F 18/2431 (2023.01); G06F 18/243 (2023.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
G01N 33/24 (2013.01); G01N 1/2813 (2013.01); G01N 1/38 (2013.01); G01N 23/2005 (2013.01); G06F 18/2431 (2023.01); G06F 18/24317 (2023.01); G01N 2033/243 (2013.01);
Abstract

The present disclosure discloses a classification method and system for fine-grained mixed sedimentary rocks, a medium and a terminal. Core description and thin section observation are used to accurately identify the sedimentary structure types and their vertical distribution characteristics from the macroscopic and microscopic perspectives, and indicates the mixed sedimentation characteristics of combination of different lamina or laminar couplets. The micro-drilling sampling technique is used to sample the samples with different types of sedimentary structures while avoiding diagenetic minerals. X-ray diffraction mineral content analysis and a high-precision carbon-sulfur analyzer are used to obtain the contents of different types of minerals and the total organic carbon contents in each sample, respectively, the basic rock type of each sample was determined using a triangular classification diagram. The name of sedimentary structure and the total organic carbon content are added in order before the name of the basic rock type.


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