The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Jun. 16, 2021
Veritx Corp., Buffalo, NY (US);
James Allen Regenor, East Aurora, NY (US);
VeriTx Corp., Buffalo, NY (US);
Abstract
A system for non-destructive examination of three-dimensional (3D) printed objects includes a muon source directs muon particles at and through the 3D object and a muon detector receives the muon particles from the muon source to produce a muon signal which is representative of the 3D object. A first computing device executes an algorithm to analyze the muon signal. The analysis comprises creating a 3D rendering of the 3D object based upon the muon signal; preparing a physics-based digital model of the 3D object; and comparing the 3D rendered object to the digital model to identify defects within the 3D object. An augmented reality (AR) device and a second computing device may communicate with the first computing device and receive the 3d rendered object and the digital model. This can used on earth, in space, on a moon or asteroid or another planet as muons occur naturally in these environments.