The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Apr. 13, 2021
Raytheon Company, Waltham, MA (US);
Randall W. Zywicki, McKinney, TX (US);
Stephen J. Schiller, La Mirada, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
A method for vicarious spatial characterization of a remote sensor system. The method includes detecting, via the remote sensor system, radiation reflected from at least one body of water corresponding to a plurality of point reflector images, selecting a set of point reflector images from the plurality of point reflector images, the selected set of point reflector images corresponding to sub-pixel point reflector images, analyzing the selected set of point reflector images by executing an algorithm for fitting the point reflector images to obtain a point spread function of the remote sensor system, and determining a spatial characteristic of the remote sensor system based on the point spread function.