The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
May. 31, 2019
Applicant:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Inventors:
Craig Prater, Santa Barbara, CA (US);
Derek Decker, Santa Barbara, CA (US);
Roshan Shetty, Westlake Village, CA (US);
Assignee:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); G06T 7/00 (2017.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01); C12M 1/00 (2006.01); C12M 1/26 (2006.01); C12M 1/34 (2006.01); C12M 1/36 (2006.01); C12N 1/12 (2006.01); H04N 23/74 (2023.01); H04N 23/741 (2023.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); C12M 21/02 (2013.01); C12M 29/00 (2013.01); C12M 29/04 (2013.01); C12M 29/22 (2013.01); C12M 33/00 (2013.01); C12M 39/00 (2013.01); C12M 41/12 (2013.01); C12M 41/26 (2013.01); C12M 41/34 (2013.01); C12M 41/36 (2013.01); C12M 41/44 (2013.01); C12M 41/48 (2013.01); C12N 1/12 (2013.01); G02B 21/06 (2013.01); G02B 21/365 (2013.01); G06T 7/97 (2017.01); H04N 23/74 (2023.01); H04N 23/741 (2023.01); G01N 2201/061 (2013.01); G01N 2201/062 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01);
Abstract
Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.