The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Feb. 18, 2022
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventors:
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0066 (2013.01); G01M 5/0033 (2013.01); G01M 5/0008 (2013.01);
Abstract
A non-contact non-destructive inspection system according to an embodiment includes a sensor, a velocity detection unit, and a damage detection unit. The sensor detects a second elastic wave emitted to a medium surrounding an inspection object due to a first elastic wave propagating through the inspection object. The velocity detection unit detects a velocity of the first elastic wave based on a wavefront angle of the second elastic wave and a velocity of the second elastic wave. The damage detection unit detects damage to the inspection object based on the velocity of the first elastic wave.