The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Mar. 18, 2020
Meidensha Corporation, Tokyo, JP;
Takao Akiyama, Tokyo, JP;
MEIDENSHA CORPORATION, Tokyo, JP;
Abstract
This system identification method includes: a step (S) for measuring frequency responses (ω, H), (ω, H) . . . , and (ω, H) in a real system under n sets of disturbances of different magnitudes; a step (S) for calculating frequency responses (ω, H), (ω, H) . . . , (ω, H) from input to output in n sets of mechanical models Mto Mn including i sets (i is an integer of 1 or greater) of common parameters that do not change due to disturbance and j sets of disturbance variable parameters that do change due to disturbance; a step (S) for calculating the values of a total of n sets of evaluation functions F (H, H) and the sum σF thereof, and steps (Sto S) for searching for the values of i sets of common parameters and j×n sets of disturbance variable parameters for which the sum σF would meet convergence conditions.