The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Mar. 26, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Akihiro Tanaka, Tokyo, JP;

Tomoyuki Hino, Tokyo, JP;

Chaitanya Prasad Narisetty, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01); B61L 23/04 (2006.01); E01C 23/01 (2006.01);
U.S. Cl.
CPC ...
G01H 9/004 (2013.01); B61L 23/042 (2013.01); E01C 23/01 (2013.01);
Abstract

A structure deterioration detection system includes an optical fiber cable that is placed along the longitudinal direction of a structure and continuously detects any vibration along the longitudinal direction of the structure, and a signal processing unit including a vibration measurement unit that measures the strength of a detected vibration, a per unit time integration unit that integrates the vibration strength for a specified period of time, an information storage unit that stores the integrated vibration strength, and a deterioration determination unit that makes a determination about whether deterioration of the structure has occurred by comparing the integrated vibration strengths at different times.


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