The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Jun. 11, 2019
Dentsply Sirona Inc., York, PA (US);
DENTSPLY SIRONA INC., York, PA (US);
Abstract
The invention relates to an optical measuring method for three-dimensionally capturing the surface of an object by means of an optical capturing unit, wherein the optical capturing unit is moved relative to the object during a first measurement time period, the object is illuminated by the capturing unit with an illumination beam having a light intensity, height images are captured by the capturing unit in succession at a capturing frequency, at least some of the captured height images during the measurement time period are added to form a total height image and the total height image is displayed, and the light intensity and/or the capturing frequency are controlled during the measurement time period by control signals, the control signals being produced at time intervals during the measurement time period and each control signal being produced on the basis of at least one sensor signal of a temperature sensor.