The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Feb. 27, 2020
Iida Co., Ltd., Kanagawa, JP;
The University of Tokyo, Tokyo, JP;
Shigeo Miyake, Fukushima, JP;
Yusuke Kajihara, Tokyo, JP;
Shuichi Nowatari, Fukushima, JP;
Seiichiro Iwasaki, Fukushima, JP;
Junya Nowatari, Fukushima, JP;
IIDA Co., Ltd., Kanagawa, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
An objective of the present invention is to provide a method, or the like, for estimating the convergence of dimensional changes in a molded article over time, by utilizing the polarization intensity of terahertz waves. The present invention provides a method for estimating the convergence of changes in the dimensions of a molded article over time, the method comprising: irradiating a molded article with terahertz waves at multiple positions thereon, wherein the molded article is irradiated with the terahertz waves at each position thereon in multiple orientations about the optical axis; measuring polarization intensities of the terahertz waves transmitted through or reflected from the molded article; and determining whether the polarization intensities at the multiple positions are in a given relationship with each other.