The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Mar. 30, 2021
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Yoshihiro Hori, Nisshin, JP;
Takayoshi Doi, Toyota, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Abstract
Provided is a pressure testing method for a high-pressure tank capable of avoiding a destruction of the high-pressure tank during a pressure test. A pressure testing method includes: extracting a plurality of AE waveforms from output waveforms of an AE sensor while increasing a pressure inside the high-pressure tank; and testing the high-pressure tank based on the extracted plurality of AE waveforms. The method includes: while increasing the pressure inside the high-pressure tank, classifying the extracted AE waveforms into first waveforms and second waveforms with a classifier that is machine-learned so as to classify the plurality of AE waveforms into the first waveforms derived from a macrocrack that increases immediately before destruction of the high-pressure tank, and the second waveforms derived from a microcrack smaller than the macrocrack; and stopping pressurization of the high-pressure tank based on the number of the first waveforms.