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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11878365 B1

PDFFull Text
Date of Patent:
Jan. 23, 2024

Filed:

Nov. 20, 2019

Focus adjustment and laser beam caustic estimation via frequency analysis of time traces and 2d raster scan data

Applicant:

Concept Laser Gmbh, Lichtenfels, DE;

Inventors:

Christian Dicken, Bamberg, DE;

Ann-Kathrin Kleinschmidt, Bamberg, DE;

Tim Klaussner, Kronach, DE;

Bertram Gaerber, Neustadt bei Coburg, DE;

Assignee:

Concept Laser GmbH, Lichtenfels, DE;

Attorney:

Dority & Manning, P.A.

Primary Examiner:

Dana Ross

Assistant Examiner:

Joe E Mills, Jr

Int. Cl.
CPC ...
B23K 26/03 (2006.01); B29C 64/393 (2017.01); B29C 64/227 (2017.01); B29C 64/268 (2017.01); B23K 26/04 (2014.01); B33Y 10/00 (2015.01); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 10/80 (2021.01); B22F 12/90 (2021.01);
U.S. Cl.
CPC ...
B23K 26/03 (2013.01); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 10/80 (2021.01); B23K 26/04 (2013.01); B29C 64/227 (2017.08); B29C 64/268 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B22F 12/90 (2021.01);
Abstract

Methods of determining at least one parameter of an irradiation device of an apparatus for additively manufacturing three-dimensional objects may include generating an energy beam and guiding the energy beam across a structured test surface, generating a signal by detecting radiation that is emitted from the test surface, and determining the at least one parameter based on a frequency spectrum of the signal.

Find Patent Forward Citations

Dicken, Christian. (2024). Focus adjustment and laser beam caustic estimation via frequency analysis of time traces and 2d raster scan data (U.S. Patent No. 11878365). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11878365

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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