The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Oct. 14, 2021
Applicant:

Panasonic Intellectual Property Corporation of America, Torrance, CA (US);

Inventor:

Tatsumi Oba, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); H04L 43/04 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 43/04 (2013.01);
Abstract

An anomaly detection method includes: calculating, for a detection target data stream of consecutive detection target data, distances between the detection target data; extracting features of the detection target data stream using the calculated distances; and calculating anomaly degree information about a degree of anomaly in the detection target data stream using the extracted features. Each extracted feature is made up of L consecutive distances (L is an integer greater than or equal to 2). For each feature extracted, supplementary information for calculating the anomaly degree information is calculated using a difference in the feature. For each of one or more information calculation target windows made up of N detection target data (N is an integer greater than or equal to L+1), the anomaly degree information is calculated using all supplementary information calculated from the N detection target data.


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