The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Sep. 12, 2022
Applicant:

Hannibal Ip Llc, Frisco, TX (US);

Inventors:

Chia-Hao Yu, Yilan, TW;

Chia-Hung Wei, Hsinchu, TW;

Assignee:

Hannibal IP LLC, Frisco, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/30 (2009.01); H04B 7/08 (2006.01); H04W 16/28 (2009.01); H04W 80/02 (2009.01); H04W 72/23 (2023.01); H04W 72/044 (2023.01);
U.S. Cl.
CPC ...
H04B 7/088 (2013.01); H04W 16/28 (2013.01); H04W 72/046 (2013.01); H04W 72/23 (2023.01); H04W 80/02 (2013.01);
Abstract

A method for SCell BFR performed by a UE is provided. The method includes: receiving a first SCell BFR configuration corresponding to a first SCell, the first SCell BFR configuration including at least one of a resource list for BFD and a resource list for NBI; detecting a beam failure condition in the first SCell by measuring at least one BFD reference signal; determining a first new candidate beam index for the first SCell based on the first SCell BFR configuration; and transmitting a beam failure recovery request that includes a cell index of the first SCell in which beam failure occurs and the determined first new candidate beam index.


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