The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Nov. 09, 2020
Applicant:

Kuang-chi Institute of Advanced Technology, Nanshan District Shenzhen, CN;

Inventors:

RuoPeng Liu, Nanshan District Shenzhen, CN;

Zhiya Zhao, Nanshan District Shenzhen, CN;

Hua Tian, Nanshan District Shenzhen, CN;

Jie Yao, Nanshan District Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/38 (2006.01); H01Q 3/40 (2006.01); G01R 29/08 (2006.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/38 (2013.01); G01R 29/0871 (2013.01); H01Q 3/267 (2013.01); H01Q 3/40 (2013.01);
Abstract

The present disclosure provides a phase compensation method and apparatus for measuring an array antenna. The phase compensation method includes: an operation S1 of exporting measured far-field directivity patterns of a first array unit and a second array unit, to establish a coordinate system, so as to determine a spatial geometrical relationship between the first array unit and the second array unit; an operation S2 of determining a wave path difference between the first array unit and the second array unit based on the spatial geometrical relationship between the first array unit and the second array unit; and an operation S3 of performing phase compensation on the second array unit based on the wave path difference.


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