The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

May. 24, 2021
Applicant:

Nuvoton Technology Corporation Japan, Kyoto, JP;

Inventors:

Yusuke Kanda, Toyama, JP;

Kenichi Miyajima, Toyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/778 (2006.01); H01L 29/45 (2006.01); H01L 29/20 (2006.01); H01L 29/78 (2006.01); H01L 29/808 (2006.01); H01L 29/812 (2006.01);
U.S. Cl.
CPC ...
H01L 29/452 (2013.01); H01L 29/2003 (2013.01); H01L 29/778 (2013.01); H01L 29/7786 (2013.01); H01L 29/7787 (2013.01); H01L 29/78 (2013.01); H01L 29/808 (2013.01); H01L 29/812 (2013.01);
Abstract

A semiconductor device includes: a channel layer not containing Al; a barrier layer above the channel layer containing Al; a recess; and an ohmic electrode in the recess, which is in ohmic contact with a two-dimensional electron gas layer. An Al composition ratio distribution of the barrier layer has a maximum point at a first position. The semiconductor device includes: a first inclined surface of the barrier layer which includes the first position and is in contact with the ohmic electrode; and a second inclined surface of the barrier layer which intersects the first inclined surface on a lower side of the first inclined surface, and is in contact with the ohmic electrode. To the surface of the substrate, an angle of the second inclined surface is smaller than an angle of the first inclined surface. A position of the first intersection line is lower than the first position.


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