The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Nov. 08, 2021
Applicants:

Imedisync. Ltd., Seoul, KR;

The Catholic University of Korea Industry-academic Cooperation Foundation, Seoul, KR;

Inventors:

Seung Wan Kang, Seoul, KR;

Namheon Kim, Paju-si, KR;

Dong Won Yang, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G16B 40/00 (2019.01); G16B 5/00 (2019.01); G06N 3/126 (2023.01);
U.S. Cl.
CPC ...
G16B 40/00 (2019.02); G06N 3/126 (2013.01); G16B 5/00 (2019.02);
Abstract

The present disclosure relates to a machine learning method and apparatus using steps feature selection based on a genetic algorithm, and the machine learning method includes defining a feature set including a plurality of features, generating a plurality of feature combinations including n-dimensional features (n is a natural number) for the feature set, independently constructing feature models for the plurality of feature combinations and calculating prediction accuracy for each of the feature models as a prediction result for a predetermined data set, arranging the feature models according to the prediction accuracy to determine at least one good feature model that satisfies a preset criterion, determining at least one good feature from among features included in a corresponding feature set of the at least one good feature model, and updating the feature set to include only the at least one good feature and re-determining a good feature model for a (n+1)-dimensional feature combination based on the updated feature set.


Find Patent Forward Citations

Loading…