The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Jun. 18, 2022
Applicant:
Edge 3 Technologies, Inc., Phoenix, AZ (US);
Inventors:
Tarek El Dokor, Phoenix, AZ (US);
Jordan Cluster, Tempe, AZ (US);
Assignee:
Edge 3 Technologies, Phoenix, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/80 (2017.01); G06T 7/00 (2017.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); G06T 7/0006 (2013.01); H04N 23/90 (2023.01); G06T 2200/21 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30108 (2013.01);
Abstract
A method and system for calibrating a lens. The method includes defining a plurality of omni-symmetrical regions within the lens, determining one or more localized lens parameters associated with each of the plurality of omni-symmetrical regions, and defining a localized set of calibration parameters for each of the plurality of omni-symmetrical region. The localized set of calibration parameters may then be employed in a computational image application.