The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Jan. 29, 2021
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventor:

Andrew Gilbert, Oslo, NO;

Assignee:

GE PRECISION HEALTHCARE LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 2207/10132 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30048 (2013.01);
Abstract

The current disclosure provides methods and systems for increasing an accuracy and/or suitability of an automated measurement of a medical image. In one embodiment, the current disclosure provides for a method comprising: receiving one or more user-selected measurement points for an automated measurement of an anatomical feature of a medical image from a user; predicting one or more additional measurement points for the automated measurement based on the one or more user-selected measurement points and based on a comparison of the anatomical feature of the medical image with a plurality of images of the anatomical feature via a trained network; and performing the automated measurement of the anatomical feature based at least on the one or more additional measurement points.


Find Patent Forward Citations

Gilbert, Andrew. (2024). Systems and methods for adaptive measurement of medical images (U.S. Patent No. 11875505). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11875505

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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