The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Jun. 22, 2021
Applicant:

National Applied Research Laboratories, Taipei, TW;

Inventors:

Chih-Wei Wang, Hsinchu, TW;

Chuan-Lin Lai, Hsinchu, TW;

Chia-Chen Kuo, Hsinchu, TW;

I-Chen Wu, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/00 (2017.01); G06F 18/2135 (2023.01);
U.S. Cl.
CPC ...
G06T 5/001 (2013.01); G06F 18/2135 (2023.01); G06T 7/0002 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method for correcting abnormal point cloud is disclosed. Firstly, receiving a Primitive Point Cloud Data set by an operation unit for dividing a point cloud array into a plurality of sub-point cloud sets and obtaining a plurality of corresponding distribution feature data according to an original vector data of the Primitive Point Cloud Data set. Furthermore, recognizing the sub-point cloud sets according to the corresponding distribution feature data for correcting recognized abnormal point cloud. Thus, when the point cloud array is rendered to a corresponding image, the color defect of the point cloud array will be improved or decreased for obtaining lossless of the corresponding image.


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