The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Jun. 15, 2021
Aspeed Technology Inc., Hsinchu, TW;
Chung-Yen Lu, Hsinchu, TW;
ASPEED TECHNOLOGY INC., Hsinchu, TW;
Abstract
An image processing method for receiving M lens images and generating a projection image is disclosed. The method comprises: determining P optimal warping coefficients of P control regions in the projection image according to a 2D error table and the M lens images from an image capture module; generating M projection images according to the M lens images, a first vertex list and the P optimal warping coefficients; determining a seam for each of N seam regions; and, stitching two overlapping seam images to generate a stitched seam image for each seam region according to its corresponding seam. The 2D error table comprises multiple test warping coefficients and multiple accumulation pixel value differences in the P control regions. The P control regions are respectively located in the N seam regions respectively located in N overlap regions, where M>=2, N>=1 and P>=3.