The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Aug. 11, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Yonathan Tate, Kfar Saba, IL;

Nir Tishbi, Kfar Saba, IL;

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01); H03M 13/45 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G11C 16/04 (2013.01); G11C 29/52 (2013.01); H03M 13/45 (2013.01);
Abstract

A memory controller includes an interface and a processor. The interface communicates with memory cells organized in multiple Word Lines (WLs). The processor is configured to read a Code Word (CW) of an Error Correction Code (ECC) from a group of multiple memory cells belonging to a target WL, to calculate for a given memory cell (i) a first soft metric, depending on a first threshold voltage of a first neighbor memory cell in a first WL neighboring the target WL, and (ii) a second soft metric, depending on a second threshold voltage of a second neighbor memory cell in a second WL neighboring the target WL, to calculate a combined soft metric based on both the first and second soft metrics and assign the combined soft metric to the given memory cell, and to decode the CW based on the combined soft metric, to produce a decoded CW.


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