The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Sep. 22, 2022
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Yosuke Kubo, Kanagawa, JP;

Hiroaki Tanaka, Kanagawa, JP;

Shigeru Fukuda, Kanagawa, JP;

Kenta Yamakoshi, Kanagawa, JP;

Masato Ono, Kanagawa, JP;

Masato Furukawa, Kanagawa, JP;

Daisuke Tanemura, Kanagawa, JP;

Masayuki Seko, Kanagawa, JP;

Koichi Matsumoto, Kanagawa, JP;

Iori Nishimura, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/16 (2006.01); G03G 15/20 (2006.01); G03G 15/01 (2006.01);
U.S. Cl.
CPC ...
G03G 15/162 (2013.01); G03G 15/0131 (2013.01); G03G 15/1605 (2013.01); G03G 15/1685 (2013.01); G03G 15/2057 (2013.01); G03G 2215/1623 (2013.01);
Abstract

An endless belt includes a resin, and particles having an average primary particle diameter of 8 nm or more and 20 nm or less. In a volume frequency distribution of the particles determined by small-angle X-ray scattering measurement, the ratio (area B/area A) of graph area B of a particle diameter region of over 35 nm to graph area A of a particle diameter region of 35 nm or less is 0.3 or less.


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