The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Apr. 05, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Benjamin Deissler, Butzbach, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An oblique plane microscope has an objective illuminating a plane of the sample and collecting detection light. A beam splitting system splits the collected detection light into two detection light bundles along two optical paths, respectively. A first intermediate imaging system generates a first intermediate image of the plane in a first intermediate image space. The first intermediate imaging system has a first objective and a first reflecting element in the first intermediate image space and reflecting the first detection light bundle into the first objective. A second intermediate imaging system generates a second intermediate image of the plane in a second intermediate image space. The second intermediate imaging system has a second objective and a second reflecting element positioned in the second intermediate image space and reflecting the second detection light bundle into the second objective. A detection system detects the detection light bundles reflected into the objectives.