The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
May. 17, 2019
Infineon Technologies Ag, Neubiberg, DE;
Hannes Plank, Graz, AT;
Infineon Technologies AG, Neubiberg, DE;
Abstract
Techniques for obtaining reflectance measurements using a time-of-flight (ToF) measurement device. An example method comprises obtaining a distance measurement, using one or more pixels in a ToF sensor, obtaining an intensity measurement corresponding to the distance measurement, using the one or more pixels, and calculating a reflectance value, based on the distance measurement, the intensity measurement, and a reflectance calibration factor. In some embodiments, the calibration distance is obtained by measuring a reference distance to a calibration surface, using a reference pixel in the ToF sensor, and obtaining the calibration distance from the measured reference distance. In some of these embodiments, the reflectance calibration factor is obtained by obtaining a reference intensity corresponding to the reference distance, using the reference pixel, and calculating the reflectance calibration factor for the one or more pixels as a function of the reference intensity and a viewing angle for the one or more pixels.