The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
May. 06, 2020
Siemens Healthcare Gmbh, Erlangen, DE;
Stephan Kannengiesser, Wuppertal, DE;
Thomas Kluge, Hirschaid, DE;
Gregor Körzdörfer, Erlangen, DE;
Mathias Nittka, Baiersdorf, DE;
Josef Pfeuffer, Kunreuth, DE;
Peter Speier, Erlangen, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
Determining parameter values in image points of an examination object in an MR system by an MRF technique. Comparison signal waveforms, established using predetermined recording parameters, and each assigned to predetermined values of the parameters to be determined, are loaded. An image point time series of the examination object is acquired with an MRF recording method such that the acquired image point time series are comparable with the loaded comparison signal waveforms. A signal comparison of a section of the respective signal waveform of the acquired one image point time series is carried out with a corresponding section of loaded comparison signal waveforms to establish similarity values. The values of the parameters to be determined on the basis of the most similar comparison signal waveforms determined are determined, and then stored or output.