The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Nov. 22, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Andreas Lagler, Munich, DE;

Florian Ramian, Munich, DE;

Karolin Werthmueller, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 31/31709 (2013.01);
Abstract

A phase noise measurement method of measuring phase noise of a device under test is described. The phase noise measurement method includes the steps of: determining, by a measurement circuit, measurement IQ data based on an output signal of a device under test; setting, by a control circuit, a magnitude threshold; determining, by an analysis circuit, critical samples of reference IQ data for which a magnitude of a reference signal is smaller than the magnitude threshold; discarding the critical samples of the reference IQ data and corresponding critical samples of the measurement IQ data, thereby obtaining modified reference IQ data and modified measurement IQ data; and determining, by the analysis circuit, a phase noise spectrum of the output signal of the device under test based on the modified reference IQ data and based on the modified measurement IQ data. Further, a measurement system is described.


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