The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Aug. 27, 2020
Applicant:

Aoi Seiki Co., Ltd., Kumamoto, JP;

Inventor:

Teruaki Itoh, Kumamoto, JP;

Assignee:

AOI SEIKIE CO., LTD., Kumamoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/04 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00861 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/1025 (2013.01);
Abstract

A specimen processing apparatus includes; a first image acquisition portion configured to capture an image of a specimen container and acquire a first image of an outer peripheral surface of the specimen container; a label removal portion configured to remove at least a part of a label attached to the outer peripheral surface of the specimen container; a second image acquisition portion configured to acquire a second image of the specimen container from which the at least part of the label is removed; and a label printing portion configured to prepare a copy label based on the first image.


Find Patent Forward Citations

Itoh, Teruaki. (2024). Specimen processing apparatus and specimen processing method (U.S. Patent No. 11874289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11874289

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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