The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Sep. 10, 2021
Applicant:

Waters Technologies Corporation, Milford, MA (US);

Inventors:

Amit Patel, Shrewsbury, MA (US);

Moon Chul Jung, Waltham, MA (US);

Thomas H. Walter, Ashland, MA (US);

Matthew A. Lauber, North Smithfield, RI (US);

Kevin Wyndham, Upton, MA (US);

Mathew DeLano, Needham, MA (US);

Jennifer Simeone, Shrewsbury, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/16 (2006.01); G01N 30/72 (2006.01); G01N 30/74 (2006.01); G01N 30/86 (2006.01); G01N 30/06 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/16 (2013.01); G01N 30/72 (2013.01); G01N 30/74 (2013.01); G01N 30/8637 (2013.01); G01N 30/06 (2013.01); G01N 2030/027 (2013.01);
Abstract

The present disclosure is directed to methods for evaluating system inertness, such as the inertness of a LC or other fluidic system. Some methods are directed to tests wherein the column has been removed prior to injecting a sample including a positive (e.g., metal reacting moiety) control into the system. Some methods can include: (1) repeatedly injecting the sample into a system, the system comprising: fluidic paths wherein interior surfaces of the fluidic paths define wetted surfaces, and wherein at least a portion of the wetted surfaces of the fluidic flow path are coated with an inert coating, wherein the inert coating is inert to at least one analyte in the sample; (2) detecting a value associated with the positive control; and (3) analyzing values associated with the detected positive control to determine system inertness.


Find Patent Forward Citations

Loading…