The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Mar. 11, 2022
Applicant:

Uchicago Argonne, Llc, Chicago, IL (US);

Inventors:

Chengjun Sun, Naperville, IL (US);

Mikhail A. Solovyev, Western Springs, IL (US);

Steve Heald, Downers Grove, IL (US);

Xiaoyi Zhang, Naperville, IL (US);

Maria Chan, Chicago, IL (US);

Shelly D. Kelly, Bolingbrook, IL (US);

Assignee:

UCHICAGO ARGONNE, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/20008 (2018.01); G01N 23/2209 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2076 (2013.01); G01N 23/20008 (2013.01); G01N 23/223 (2013.01); G01N 23/2209 (2018.02); G01N 2223/0568 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/30 (2013.01); G01N 2223/50 (2013.01);
Abstract

Spectroscopy systems require a crystal having specific properties for analyzing a spectrum of a sample, which is typically performed for measuring the presence of one element at a time. A two-dimensional (2D) crystal mount for performing simultaneous spectroscopy measurements includes a crystal holder having multiple rows of crystal mounts. Each crystal mount is positioned and orientated to physically support a crystal at a fixed position and fixed orientation relative to an optical axis. A sample provides radiation to analyzer crystals disposed in the crystal mounts, and a detector may detect radiation reflected from the analyzer crystals, for performing multiple simultaneous spectroscopy measurements.


Find Patent Forward Citations

Loading…