The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
May. 04, 2021
Horiba Instruments Incorporated, Irvine, CA (US);
Horiba Advanced Techno Co., Ltd., Kyoto, JP;
Adam Matthew Gilmore, Flemington, NJ (US);
HORIBA INSTRUMENTS INCORPORATED, Irvine, CA (US);
HORIBA ADVANCED TECHNO CO., LTD., Kyoto, JP;
Abstract
A computer-implemented method includes controlling an instrument to measure a fluorescence emission spectrum of a sample including a first peak emission wavelength and at least a second peak emission wavelength, emitted in response to an excitation wavelength and controlling the instrument to measure an absorbance obtained at the excitation wavelength of the sample. The method may include determining, using the computer, a ratio of the measurements at either the second peak emission wavelength, or a sum of measurements at a plurality of peak emission wavelengths including at least the first peak emission wavelength and the second peak emission wavelength, to the first peak emission wavelength, and calculating, using the computer, a value for a quality parameter based on a combination of at least the ratio and the absorbance measurement. The method may include controlling an associated process based on the quality parameter.