The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Jun. 22, 2021
Applicant:
King Abdullah University of Science and Technology, Thuwal, SA;
Inventors:
Congli Wang, Thuwal, SA;
Xiong Dun, Thuwal, SA;
Qiang Fu, Shanghai, CN;
Wolfgang Heidrich, Thuwal, SA;
Assignee:
King Abdullah University of Science and Technology, Thuwal, SA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/02 (2006.01); G03F 7/00 (2006.01); G01J 9/00 (2006.01);
U.S. Cl.
CPC ...
G01J 9/02 (2013.01); G01J 9/00 (2013.01); G01J 9/0215 (2013.01); G03F 7/001 (2013.01); G01J 2009/002 (2013.01);
Abstract
A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.